Merge branch 'master' into feature/basic-app-install-flow

lazarkov · May 14, 2024 · 5407248 · 5407248
2 parents 33b5912 + 878fbb7
commit 5407248
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Showing 45 changed files with 271 additions and 257 deletions.
diff --git a/config/esp32/components/chip/Kconfig b/config/esp32/components/chip/Kconfig
@@ -1232,47 +1232,47 @@ menu "CHIP Device Layer"
     menu "Message Reliable Protocol Options"
         config MRP_LOCAL_ACTIVE_RETRY_INTERVAL_FOR_THREAD
             int "MRP local active retry interval for Thread network in milliseconds"
-            depends on OPENTHREAD_ENABLED
+            depends on ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 800
             help
                 Base retry interval of the present Thread node when it is in the active state.
 
         config MRP_LOCAL_ACTIVE_RETRY_INTERVAL_FOR_WIFI_ETHERNET
             int "MRP local active retry interval for WIFI or ETHERNET network in milliseconds"
-            depends on !OPENTHREAD_ENABLED
+            depends on !ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 300
             help
                 Base retry interval of the present node (WIFI or ETHERNET) when it is in the active state.
 
         config MRP_LOCAL_IDLE_RETRY_INTERVAL_FOR_THREAD
             int "MRP local idle retry interval for Thread network in milliseconds"
-            depends on OPENTHREAD_ENABLED
+            depends on ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 800
             help
                 Base retry interval of the present Thread node when it is in the idle state.
 
         config MRP_LOCAL_IDLE_RETRY_INTERVAL_FOR_WIFI_ETHERNET
             int "MRP local idle retry interval for WIFI or ETHERNET network in milliseconds"
-            depends on !OPENTHREAD_ENABLED
+            depends on !ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 500
             help
                 Base retry interval of the present node (WIFI or ETHERNET) when it is in the idle state.
 
         config MRP_RETRY_INTERVAL_SENDER_BOOST_FOR_THREAD
             int "MRP retransmission delta timeout for Thread network in milliseconds"
-            depends on OPENTHREAD_ENABLED
+            depends on ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 500
             help
                 A constant value added to the calculated retransmission timeout.
 
         config MRP_RETRY_INTERVAL_SENDER_BOOST_FOR_WIFI_ETHERNET
             int "MRP retransmission delta timeout for WIFI or ETHERNET network in milliseconds"
-            depends on !OPENTHREAD_ENABLED
+            depends on !ENABLE_MATTER_OVER_THREAD
             range 0 3600000
             default 0
             help

diff --git a/examples/platform/silabs/FreeRTOSConfig.h b/examples/platform/silabs/FreeRTOSConfig.h
@@ -197,7 +197,7 @@ See http://www.FreeRTOS.org/RTOS-Cortex-M3-M4.html. */
 #define configMAX_SYSCALL_INTERRUPT_PRIORITY 48
 #endif // SLI_SI91X_MCU_INTERFACE
 
-#define configENABLE_FPU 0
+#define configENABLE_FPU 1
 #define configENABLE_MPU 0
 /* FreeRTOS Secure Side Only and TrustZone Security Extension */
 #define configRUN_FREERTOS_SECURE_ONLY 1

diff --git a/src/BUILD.gn b/src/BUILD.gn
@@ -92,9 +92,9 @@ if (chip_build_tests) {
       ]
     }
 
+    # Skip on efr32 due to flash and/or ram limitations.
     if (chip_device_platform != "efr32") {
       tests += [
-        # TODO(#10447): App test has HF on EFR32.
         "${chip_root}/src/app/tests",
         "${chip_root}/src/credentials/tests",
         "${chip_root}/src/lib/format/tests",
@@ -128,7 +128,7 @@ if (chip_build_tests) {
     # https://github.com/project-chip/connectedhomeip/issues/9630
     if (chip_device_platform != "nrfconnect" &&
         chip_device_platform != "efr32") {
-      # TODO(#10447): Controller test has HF on EFR32.
+      # Doesn't compile on ef32. Multiple definitions issues with attribute storage and overflows flash memory.
       tests += [ "${chip_root}/src/controller/tests/data_model" ]
 
       # Skip controller test for Open IoT SDK

diff --git a/src/app/icd/server/tests/TestICDManager.cpp b/src/app/icd/server/tests/TestICDManager.cpp
@@ -1061,10 +1061,15 @@ TEST_F(TestICDManager, TestICDStateObserverOnTransitionToIdleModeEqualActiveMode
 
     // Expire IdleMode timer
     AdvanceClockAndRunEventLoop(1_s);
-    EXPECT_FALSE(mICDStateObserver.mOnTransitionToIdleCalled);
+    // In this scenario, The ICD state machine kicked a OnTransitionToIdle timer with a duration of 0 seconds.
+    // The freeRTOS systemlayer timer calls a 0s timer's callback instantly while on posix it take and 1 addition event loop.
+    // Thefore, the expect result diverges here based on the systemlayer implementation. Skip this check.
+    // https://github.com/project-chip/connectedhomeip/issues/33441
+    // EXPECT_FALSE(mICDStateObserver.mOnTransitionToIdleCalled);
 
     // Expire OnTransitionToIdleMode
     AdvanceClockAndRunEventLoop(1_ms32);
+    // All systems should have called the OnTransitionToIdle callback by now.
     EXPECT_TRUE(mICDStateObserver.mOnTransitionToIdleCalled);
 
     // Reset Old durations

diff --git a/src/app/tests/AppTestContext.h b/src/app/tests/AppTestContext.h
@@ -28,13 +28,13 @@ class AppContext : public LoopbackMessagingContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override;
+    static void SetUpTestSuite();
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override;
+    static void TearDownTestSuite();
     // Performs setup for each individual test in the test suite
-    void SetUp() override;
+    void SetUp();
     // Performs teardown for each individual test in the test suite
-    void TearDown() override;
+    void TearDown();
 };
 
 } // namespace Test

diff --git a/src/app/tests/TestAclAttribute.cpp b/src/app/tests/TestAclAttribute.cpp
@@ -259,10 +259,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "TestAclAttribute",
     &sTests[0],
-    TestAccessContext::nlTestSetUpTestSuite,
-    TestAccessContext::nlTestTearDownTestSuite,
-    TestAccessContext::nlTestSetUp,
-    TestAccessContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestAccessContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestAccessContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestAccessContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestAccessContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestAclEvent.cpp b/src/app/tests/TestAclEvent.cpp
@@ -377,10 +377,10 @@ nlTestSuite sSuite =
 {
     "TestAclEvent",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestBufferedReadCallback.cpp b/src/app/tests/TestBufferedReadCallback.cpp
@@ -610,10 +610,10 @@ nlTestSuite theSuite =
 {
     "TestBufferedReadCallback",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

diff --git a/src/app/tests/TestClusterStateCache.cpp b/src/app/tests/TestClusterStateCache.cpp
@@ -695,10 +695,10 @@ nlTestSuite theSuite =
 {
     "TestClusterStateCache",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 }

diff --git a/src/app/tests/TestCommandInteraction.cpp b/src/app/tests/TestCommandInteraction.cpp
@@ -2120,10 +2120,10 @@ nlTestSuite sSuite =
 {
     "TestCommandInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestEventLogging.cpp b/src/app/tests/TestEventLogging.cpp
@@ -318,10 +318,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "EventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestEventLoggingNoUTCTime.cpp b/src/app/tests/TestEventLoggingNoUTCTime.cpp
@@ -84,16 +84,16 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override
+    static void SetUpTestSuite()
     {
         chip::Test::AppContext::SetUpTestSuite();
-        mClock.Emplace(chip::System::SystemClock());
+        sClock.Emplace(chip::System::SystemClock());
     }
 
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override
+    static void TearDownTestSuite()
     {
-        mClock.ClearValue();
+        sClock.ClearValue();
         chip::Test::AppContext::TearDownTestSuite();
     }
 
@@ -125,9 +125,11 @@ class TestContext : public chip::Test::AppContext
 
 private:
     chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
-    chip::Optional<MockClock> mClock;
+    static chip::Optional<MockClock> sClock;
 };
 
+chip::Optional<MockClock> TestContext::sClock;
+
 void ENFORCE_FORMAT(1, 2) SimpleDumpWriter(const char * aFormat, ...)
 {
     va_list args;
@@ -370,10 +372,10 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "EventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 } // namespace

diff --git a/src/app/tests/TestEventOverflow.cpp b/src/app/tests/TestEventOverflow.cpp
@@ -169,10 +169,10 @@ nlTestSuite sSuite =
 {
     "TestEventOverflow",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestFabricScopedEventLogging.cpp b/src/app/tests/TestFabricScopedEventLogging.cpp
@@ -278,10 +278,10 @@ nlTestSuite sSuite =
 {
     "TestFabricScopedEventLogging",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestInteractionModelEngine.cpp b/src/app/tests/TestInteractionModelEngine.cpp
@@ -773,10 +773,10 @@ nlTestSuite sSuite =
 {
     "TestInteractionModelEngine",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 // clang-format on
 

diff --git a/src/app/tests/TestReadInteraction.cpp b/src/app/tests/TestReadInteraction.cpp
@@ -79,13 +79,13 @@ class TestContext : public chip::Test::AppContext
 {
 public:
     // Performs shared setup for all tests in the test suite
-    void SetUpTestSuite() override
+    static void SetUpTestSuite()
     {
         chip::Test::AppContext::SetUpTestSuite();
         gRealClock = &chip::System::SystemClock();
         chip::System::Clock::Internal::SetSystemClockForTesting(&gMockClock);
 
-        if (mSyncScheduler)
+        if (sSyncScheduler)
         {
             gReportScheduler = chip::app::reporting::GetSynchronizedReportScheduler();
             sUsingSubSync    = true;
@@ -96,14 +96,8 @@ class TestContext : public chip::Test::AppContext
         }
     }
 
-    static int nlTestSetUpTestSuite_Sync(void * context)
-    {
-        static_cast<TestContext *>(context)->mSyncScheduler = true;
-        return nlTestSetUpTestSuite(context);
-    }
-
     // Performs shared teardown for all tests in the test suite
-    void TearDownTestSuite() override
+    static void TearDownTestSuite()
     {
         chip::System::Clock::Internal::SetSystemClockForTesting(gRealClock);
         chip::Test::AppContext::TearDownTestSuite();
@@ -133,9 +127,21 @@ class TestContext : public chip::Test::AppContext
         chip::Test::AppContext::TearDown();
     }
 
-private:
+protected:
     chip::MonotonicallyIncreasingCounter<chip::EventNumber> mEventCounter;
-    bool mSyncScheduler = false;
+    static bool sSyncScheduler;
+};
+
+bool TestContext::sSyncScheduler = false;
+
+class TestSyncContext : public TestContext
+{
+public:
+    static void SetUpTestSuite()
+    {
+        sSyncScheduler = true;
+        TestContext::SetUpTestSuite();
+    }
 };
 
 class TestEventGenerator : public chip::app::EventLoggingDelegate
@@ -5146,19 +5152,19 @@ const nlTest sTests[] = {
 nlTestSuite sSuite = {
     "TestReadInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestContext, TearDown),
 };
 
 nlTestSuite sSyncSuite = {
     "TestSyncReadInteraction",
     &sTests[0],
-    TestContext::nlTestSetUpTestSuite_Sync,
-    TestContext::nlTestTearDownTestSuite,
-    TestContext::nlTestSetUp,
-    TestContext::nlTestTearDown,
+    NL_TEST_WRAP_FUNCTION(TestSyncContext::SetUpTestSuite),
+    NL_TEST_WRAP_FUNCTION(TestSyncContext::TearDownTestSuite),
+    NL_TEST_WRAP_METHOD(TestSyncContext, SetUp),
+    NL_TEST_WRAP_METHOD(TestSyncContext, TearDown),
 };
 
 } // namespace