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test(core): decrease single test timeout for HW devices to 10 minutes #5079

test(core): decrease single test timeout for HW devices to 10 minutes

test(core): decrease single test timeout for HW devices to 10 minutes #5079

Triggered via pull request March 6, 2025 19:05
Status Success
Total duration 17m 5s
Artifacts 7

legacy.yml

on: pull_request
Matrix: Emulator
Matrix: Emulator arm
Matrix: Firmware
Matrix: Device test
HWI test
0s
HWI test
Matrix: Upgrade test
Upload emulator binaries
0s
Upload emulator binaries
UI diff from main branch
2m 35s
UI diff from main branch
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Artifacts

Produced during runtime
Name Size
legacy-emu-btconly-debuglink-noasan
1.99 MB
legacy-emu-universal-debuglink-noasan
2.27 MB
legacy-firmware-btconly-debuglink
260 KB
legacy-firmware-btconly-normal
254 KB
legacy-firmware-universal-debuglink
308 KB
legacy-firmware-universal-normal
301 KB
ui-records-legacy_device_test-0
1.07 MB